Friday, 2D-04, 3:40-3:50

Thick Films with Enhanced Pinning via Self-assembled Columnar Defects

A. Goyal

Oak Ridge National Laboratory, PO Box 2008, MS 6116, Oak Ridge, TN 37831
Ph.-(865) 574-1587; Fax-(865)574-7659; Email-goyala@ornl.gov

This talk will summarize the work on flux-pinning via self-assembled columnar defects in REBCO-type coated conductors. Data will be presented for films made via both the in-situ PLD and MOCVD techniques, highlighting the similarity in the morphology of self-assembled columnar defect structures and the resulting effects on flux-pinning. Challenges in the fabrication of reproducible, high performance thick films and how the incorporation of columnar defects mitigates some of these effects will be discussed. Different types of second phase material which can be incorporated as self-assembled columnar defects and their effectiveness in pinning will be reviewed. Research was sponsored by the US Department of Energy, Office of Electricity Delivery and Energy Reliability- Superconductivity Program, under contract DE-AC05-00OR22725 with UT-Battelle, LLC managing contractor for Oak Ridge National Laboratory.

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