program abstracts
Friday, 2D-15, 5:30-5:40
Characterization of Coated Conductors Using Raman Spectroscopy Methods
Victor A. Maroni
Argonne National Laboratory, 9700 South Cass Ave. Argonne, IL 60439 USA
Phone 630-252-4547, Fax 630-972-4547, maroni@anl.gov
This presentation will address the type of information gained from the use of Raman spectroscopy and Raman microscopy methods to examine REBCO coated conductor embodiments. The topics covered will include (1) the capabilities and limitations of Raman spectroscopy in providing guidance for coated conductor performance enhancement, (2) the potential applicability of Raman methods for use as ex-situ and in-situ probes of phase and microstructure development (considering both off-line and on-line implementation), (3) the features, details, differences, and length scales for which Raman is both suitable and informative for interrogating REBCO, (4) the extent to which Raman can be used to characterize other layers, such as buffers, diffusion barriers, and templates, and (5) information on the idiosyncrasies and limitations of Raman methods for the study of coated conductor embodiments based in large part on the presenters experience. The methodology for proper application of Raman spectroscopy, microscopy, and imaging techniques will also be addressed, including considerations pertaining to sampling depth, through-thickness measurement approaches, the creation of Raman-based chemical maps, and the interpretation of Raman spectral data. Features readily detected by Raman that are not generally observable in a collective manner using other individual characterization tools include oxygen stoichiometry of the REBCO phase, REBCO texture quality, the occurrence and approximate magnitude of lattice atom disorder in the REBCO, and the presence of typical non-superconducting second phases, such as CuO, Cu2O, Y2Cu2O5, and the various barium cuprates. Examples of Raman-based through-process tracking of phase transformations during precursor conversion to REBCO will also be presented and discussed.
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This research was sponsored by the U.S. Department of Energy (DOE), Office of Electricity Delivery and
Energy Reliability, as part of a DOE program to develop electric power technology, under contract DEAC02-06CH11357 between UChicago Argonne, LLC and the DOE
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