Friday, 2E-13, -

In Field Low Temperature Laser Scanning Study of Artificial Defects on IBAD YBCO Coated Conductor

Pei Li

Dmytro Abraimov, David Larbalestier

Applied Superconductivity Center, National High Magnetic Field Laboratory, 2031 East Paul Dirac Drive, Tallahassee, FL 32310 USA

Yi-Yuan Xie, Yimin Chen, Venkat Selvamanickam

SuperPower, Inc., 450 Duane Ave., Schenectady, NY 12304 USA

Many types of commercial YBCO coated conductors (CC) have obstacles obstructing current flow, especially grain boundaries (GBs) with 3~10° misorientation angles which partially block current and force percolative current flow around obstacles. Application of YBCO coated conductors requires understanding of the local dissipation caused by these grain boundaries. By using precisely controlled Focused Ion Beam, artificial obstructions were patterned on a quasi-single crystal-like IBAD-MOCVD YBCO CC sample to simulate real GBs. We used Low Temperature Laser Scanning Microscopy (LTLSM) to map the local electric field distribution on these samples and found the dissipation maps to depend on the orientation of external magnetic field with respect to the artificial GBs. Strong local dissipation was caused around artificial GBs by preferential flux penetration when GBs and the field were parallel. We also found dissipation became more non-uniform under Lorentz force-free (longitudinal magnetic field) configuration.

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